Combined measurement
Roughness and contour measurement in one go
A high resolution scanning system detects roughness and contour simultaneously in one trace.
One measuring station for two areas of application with a uniform user interface.
The suitable roughness or contour probe is used depending on the measuring task.
HOMMEL nanoscan 855
The new standard in combined roughness and contour measurement
Precision
Absolute precision in surface measurements with a resolution of 0.6 nm at 24 mm measurement stroke
IIntelligent probe arm
Avoidance of measuring errors by electronic identification of the probe arm. This rules out operating and measuring errors
.
Electronic probe arm protection
Avoidance of probe tip damage by electronic protective device reduces the running costs and guarantees the measuring accuracy
Measuring force in up and down direction
Pick-ups with twin tips enable to measure roughness and contour in ordinary location as well as over head measurements without pick up exchange. Applications can be solved more flexible through this technique
Automatic measurement runs
CNC-capable axes allow fully automatic measurement runs in the shortest time and guarantee reproducible measurement results
Direct user control
Measurement tasks can be set up and performed directly on the operator panel
Optimum measuring station
Active vibration damping, high-precision traverse unit and stable measuring column guarantee optimum measurement results
Technical data HOMMEL nanoscan 855
Scanning system |
|
| Measuring range |
24 mm |
| Resolution |
0,6 nm |
| Measurement force |
±1 mN bis 50 mN, programmable |
| Probing direction |
Z+ / Z- , programmable |
| Probe tip protection |
electronic limiting of the lowering speed |
| Positioning accuracy probe tip in Z |
±10 #m |
Probe arm |
|
| Probe arm length (standard) |
90 mm |
| Probe tip |
2 #m / 60° |
| Probe arm holder |
magnetic with collision protection |
| Probe arm detector |
electronic |
Traverse unit |
|
| Measuring range (traverse length) |
200 mm |
| Resolution |
10 nm bis 10 #m |
| Measurement speed |
0,01 - 6 mm/sec |
| Positioning speed |
max. 12 mm/sec |
| Straightness guidance |
# 0,4 #m / 200 mm |
Measuring column |
|
| Travel |
550 mm |
| Straightness |
0,5 #m / 100 mm |
| Traversing speed |
0,1 - 50 mm/sec |
| Repetitive positioning accuracy |
# 10 #m |
Measuring station |
|
| Granite plate |
850x600x140 mm |
| Damping |
active damping with level adjustment |
| Measuring station |
1190x780 mm |
| Computer table |
810x780 mm |
| Cabin |
optional |
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HOMMEL TESTER T8000 RC
Combined roughness and contour measuring station for highest requirements.
One measuring station for two areas of application with a uniform user interface. The suitable roughness or contour probe is used depending on the measuring task. The probe change takes place in seconds, whereby the whole traverse length can also be used for the roughness measurement. Combined roughness and contour measuring tasks can also be performed if necessary in one CNC program run without changing the probe and displayed in a common log. Even complex measuring tasks with a very large number of measurement positions can be handled easily and reliably.
| Model |
Measuring range
Z axis |
Resolution
Z axis |
Measuring range
X axis |
Resolution
X axis |
Travel measuring column
|
Stone plate |
| T8000 RC12-400 |
60 mm |
0,05µm |
120 mm |
0,10 µm |
400 mm |
750x500 mm |
| T8000 RC120-400L |
60 mm |
0,05µm |
120 mm |
0,10 µm |
400 mm |
1000x500 mm |
| T8000 RC120-800L |
60 mm |
0,05µm |
120 mm |
0,10 µm |
800 mm |
1000x500 mm |
| T8000 RC120-800L |
60 mm |
0,05µm |
120 mm |
0,10 µm |
800 mm |
1000x500 mm |
Delivery and performance characteristics
- Evaluation unit HOMMEL TESTER T8000
- PC-based evaluation unit including software
- Incl. 17" TFT monitor and printer
- Stone plate with T groove, 780 x 500 mm or 1000 x 500 mm
- Motorised measuring column waveliftTM 400 or waveliftTM 800
- Travel 400 mm or 800 mm
- Automatic probe positioning
- Traverse units wavelineTM 120
- Traverse length 120 mm
- Guide accuracy 0.4 µm / 120 mm
- Max. resolution 0.1 µm or 0.01 µm
Contour probe wavecontourTM digital
- Digital contour probe with 60 mm measurement stroke
- Tilt unit,
- Rough adjustment range ± 45°
- Fine adjustment range ± 5
- Measuring table MT1
- Two co-ordinates +/-12.5 mm adjustabl
- Rotatable +/- 5° um vertical axis
- Contact surface: 160x160 mm
- Calibration set with ceramic gauge block and ceramic measuring sphere
- Probe set TKU 300/600
- Measuring range ± 300 µm (with TS2 ± 600 µm)
- incl. 4 exchangeable probe arms
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HOMMEL TESTER T8000 SC
Roughness and contour measurement in one go.
A high resolution scanning system detects roughness and contour simultaneously in one trace.
The resolution of 6 nm is retained over the whole measurement stroke of 6 mm. Maximum time saving with accurate results is the outcome. With the HOMMEL TESTER T8000 SC, the complexity of the measuring tasks is reduced to the essential. Roughness measurements on angled surfaces or curved surfaces is no longer a problem and can now be performed without mechanical alignment of the workpiece. The software allows the evaluation of contour and roughness parameters on one profile. The CNC option allows measurements to run automatically and further reduces the measurement time.
The magnetic probe arm holder protects the probe arms from damage and allows fast probe arm changing.
| Model |
Measuring range
Z axis |
Resolution
Z axis |
Measuring range
X axis |
Resolution
X axis |
Travel
measuring
column
|
Stone plate |
| T8000 SC12-400 |
6 mm |
6 nm |
120 mm |
0,25 µm |
400 mm |
780x500 mm |
Scope of delivery and performance
- Evaluation unit HOMMEL TESTER T8000
- PC-based evaluation unit including software
- Incl. 17" TFT monitor and printer
- Stone plate with T groove, 780 x 500 mm
- Motorised measuring column waveliftTM
- Travel 400 mm
- Automatic probe positioning
- Traverse units wavelineTM 120
- Traverse length 120 mm
- Guide accuracy 0.4 µm/120 mm
- Tilt unit for wavelineTM 60
- Rough adjustment range ± 45°
- Fine adjustment range ± 5°
- Measuring table MT1
- Two co-ordinates # 12.5 mm adjustable
- Rotatable #5# um vertical axis
- Contact surface: 160 x 160 mm
- Combined roughness and contour probe wavecontourTM surfscan
- Measuring range 6 mm, resolution 6 nm
- incl. probe rod with diamond tip 5 µm/60#
- incl. probe rod with ruby sphere, d=1 mm
- Calibration set with gauge blocks and ruby measuring sphere
- Geometry standard RNDH 2
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