Contour measurement system
Our measuring systems of the HOMMEL WAVELINE family are split into MICROSYSTEM for measurement of roughness and waviness (microstructures) and MACROSYSTEM for the evaluation of contours (macrostructures). Both categories will be treated separately as they have different causes and often influence the functionality of the part in another way.

The shape of a part is based on the macrostructure (form, position, dimension) and the microstructure (roughness and waviness) of the reference surface. Every part will show a certain deviation of the desired, geometrically ideal shape, caused by the machining tool.


Our systems offer a wide range of different parameters, the representativity of which differs significantly. The surface parameters to be measured have to be selected according to the criteria that have to be differentiated from each other.

The contour measurement basically entails determining the angles, radii, distances and co-ordinates as well as the computercontrolled nominal-actual comparison with measured or CAD-based profile data.

The contour measuring systems HOMMEL WAVELINE MACROSYSTEM are designed in modules and can be easily combined for your measuring tasks.

HOMMEL TESTER T8000

The stationary roughness measuring station for all applications. The PC-based roughness measuring stations leave nothing to be desired in terms of the evaluation possibilities for calculation and representation of the roughness parameters according to international standards. Even complex measuring tasks can be implemented with these systems. With the optional CNC software, measurements can be made fully automatically. Whether in the measuring room or on the production line, the HOMMEL TESTER T8000 is available in all suitable configurations. The modular concept allows these roughness measuring stations to be extended for topography measurement or contour measurement at any time later and are therefore a safe investment. You have the choice, we have the right measuring station configuration depending on the workpiece size and measuring task:

Model MEASURING range X axis Travel measuring column Stone plate
T8000 R60-400 60 mm 400 mm 780x500 mm
T8000 R120-400 120 mm 400 mm 780x500 mm
T8000 R120-800L 120 mm 800 mm 1000x500 mm

 

Delivery and performance characteristics

Evaluation unit HOMMEL TESTER T8000
- PC-based evaluation unit including software
- Incl. 17" TFT monitor and printer

Stone plate with T groove, 780 x 500 mm or 1000 x 500 mm

Motorised measuring column waveliftTM 400 or waveliftTM 800
- Travel 400 mm or 800 mm
- Automatic probe positioning

Traverse units wavelineTM 60 or wavelineTM 120
- Traverse length 60mm or 120 mm
- Guide accuracy 0.2 µm/60 mm or 0.4 µm/120 mm

Tilt unit for wavelineTM 60/120
- Rough adjustment range ± 45°
- Fine adjustment range ± 5°

Probe set TKU 300/600
- Measuring range ± 300 µm (with TS2 ± 600 µm)
- incl. 4 exchangeable probe arms

Geometry standard RNDH 2

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HOMMEL TESTER C8000
The contour measurement system for demanding applications.

The exact measurement of workpiece contours demands high precision metrology in connection with an efficient evaluation software. The stationary contour measurement systems from HOMMEL-ETAMIC combine both requirements and therefore offer reliable measurement results with simple handling. Evaluations of distances, radii, angles or nominal/actual profile comparisons also takes place automatically if necessary and thus guarantee reproducible results without operator intervention. With the CNC option the whole measuring process runs fully automatically and requires much less time than a manual measurement sequence.
You have the choice, we have the right measuring station configuration depending on the workpiece size and measuring task:

Contour probe
Measurement principle

Measuring range
Z axis
Resolution
Z axis
Measuring range
X axis
C 8000 inductive analogue 20 mm 0,066µm 120 mm
C 8000 digital digital 60 mm 0,05µm 120 mm

Delivery and performance characteristics

  • Evaluation unit HOMMEL TESTER C8000
    - PC-based evaluation unit including software
    - Incl. 17" TFT monitor and printer
  • Stone plate with T groove, 630 x 500 mm
  • Motorised measuring column waveliftTM 400
    - Travel 400 mm
    - Automatic probe positioning
  • Traverse units wavelineTM 120 contour
    - Traverse length 120 mm
    - Guide accuracy 0.4 µm / 120 mm
    - Max. resolution 0.1 µm
  • Tilt unit, rough adjustment range ± 45°
  • Measuring table MT1
    - Two co-ordinates +/- 12.5 mm adjustable
    - Rotatable +/- 5° um vertical axis
    - Contact surface: 160 x 160 mm
  • Calibration set with ceramic gauge block and ceramic measuring sphere


 

 

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